Accurate and Low-Cost Residual Risk Assessment via Sampled Profiling and Structure-Aware Coverage Amplification
Seongmin Lee, Işıl Özgü, Marcel Böhme, and Miryung Kim. 2026. "Accurate and Low-Cost Residual Risk Assessment via Sampled Profiling and Structure-Aware Coverage Amplification." In Proceedings of the 41st IEEE/ACM International Conference on Automated Software Engineering (ASE '26), October 12–16, 2026, Munich, Germany. ACM, New York, NY, USA, 12 pages. https://doi.org/10.1145/3832783.3837519
